Planken, P. C. M., Pellemans, H. P. M., van Son, P. C., Hovenier, J. N., Klaassen, T. O., Wenckebach, W. T., … Langerak, C. . (1996). Using far-infrared two-photon excitation to measure the resonant-polaron effect in the Reststrahlen band of GaAs:Si. Optics Communications, 124, 258-262. https://doi.org/10.1016/0030-4018(95)00676-1 (Original work published)
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