M. J. van der Wiel

van Amersfoort, P. W., Best, R. W. B., Vanbuuren, R., Delmee, P. F. M., Faatz, B., van der Geer, C. A. J., … van der Wiel, M. J. (1990). Status and Research Objectives of the Dutch Free-Electron Laser for Infrared Experiments. Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, 296, 217-221. https://doi.org/10.1016/0168-9002(90)91212-t (Original work published 1990)

van Amersfoort, P. W., Best, R. W. B., Faatz, B., van der Geer, C. A. J., Mastop, W. J., Meddens, B. J. H., … van der Wiel, M. J. (1989). Status of the Dutch Free-Electron Laser for Infrared Experiments. Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, 285, 67-70. https://doi.org/10.1016/0168-9002(89)90427-0 (Original work published 1989)

van der Wiel, M. J., & van Amersfoort, P. W. (1989). A Role for Free-Electron Lasers in Fusion. Fusion Engineering and Design, 11, 245-253. https://doi.org/10.1016/0920-3796(89)90022-7 (Original work published 1989)

Vanbrug, H., van Dorssen, G. E., & van der Wiel, M. J. (1989). Si L-Edge Structures in the Soft-X-Ray Reflectivity of Laser-Annealed Si Surfaces (with Ni Overlayers). Surface Science, 210, 69-84. https://doi.org/10.1016/0039-6028(89)90103-9 (Original work published 1989)

Vanbrug, H., van der Wiel, M. J., Vanderpol, R., Verhoeven, J., Vanderlaan, G., & Goedkoop, J. B. (1988). Reflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 6, 2182-2187. https://doi.org/10.1116/1.575009 (Original work published 1988)

Puik, E. J., van der Wiel, M. J., Zeijlemaker, H., & Verhoeven, J. (1988). The Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors. Vacuum, 38, 707-709. https://doi.org/10.1016/0042-207x(88)90447-2 (Original work published 1988)

Vanbrug, H., Bijkerk, F., van der Wiel, M. J., & Vanwingerden, B. (1987). Low-Z Element Analysis by Soft-X-Ray Line Emission of a Laser-Produced Plasma. Journal of Analytical Atomic Spectrometry, 2, 503-507. https://doi.org/10.1039/ja9870200503 (Original work published 1987)