Interwell relaxation times in p-Si/SiGe asymmetric quantum well structures: Role of interface roughness

Label	Value
Author	M. Califano N. Q. Vinh P. J. Phillips Z. Ikonic R. W. Kelsall P. Harrison C. R. Pidgeon B. N. Murdin D. J. Paul P. Townsend J. Zhang I. M. Ross A. G. Cullis
Year of Publication	2007
Journal	Physical Review B
Volume	75
Number	4
Date Published	Jan
ISBN Number	1098-0121
Accession Number	ISI:000243895600100
URL	<Go to ISI>://000243895600100
PId	3d6563e23717aefaec933dc4643ec279
	Journal Article
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