J. Verhoeven

Verhoeven, J., Zeijlemaker, H., Puik, E. J., & van der Wiel, M. J. (1990). On the Use of H+ and Ar+ Ions for High Spatial-Resolution Depth Profiling. Vacuum, 41, 1327-1329. https://doi.org/10.1016/0042-207x(90)93948-i (Original work published 1990)

Vanbrug, H., van der Wiel, M. J., Vanderpol, R., Verhoeven, J., Vanderlaan, G., & Goedkoop, J. B. (1988). Reflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 6, 2182-2187. https://doi.org/10.1116/1.575009 (Original work published 1988)

Puik, E. J., van der Wiel, M. J., Zeijlemaker, H., & Verhoeven, J. (1988). The Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors. Vacuum, 38, 707-709. https://doi.org/10.1016/0042-207x(88)90447-2 (Original work published 1988)