DIFFER

M. Creatore

First name
M.
Last name
Creatore
Beyene, H. T., Weber, J. W., Verheijen, M. A., van de Sanden, M. C. M., & Creatore, M. (2012). Real time in situ spectroscopic ellipsometry of the growth and plasmonic properties of au nanoparticles on SiO2. Nano Research, 5(8), 513-520. https://doi.org/10.1007/s12274-012-0236-z (Original work published 2025)
Ponomarev, M. V., Verheijen, M. A., Keuning, W., van de Sanden, M. C. M., & Creatore, M. (2012). Controlling the resistivity gradient in chemical vapor deposition-deposited aluminum-doped zinc oxide. Journal of Applied Physics, 112(4), 04370. https://doi.org/10.1063/1.4747942 (Original work published 2025)
Sharma, K., Branca, A., Illiberi, A., Tichelaar, F. D., Creatore, M., & van de Sanden, M. C. M. (2011). On the Effect of the Amorphous Silicon Microstructure on the Grain Size of Solid Phase Crystallized Polycrystalline Silicon. Advanced Energy Materials, 1(3), 401-406. https://doi.org/10.1002/aenm.201000074 (Original work published 2025)
Beyene, H. T., Tichelaar, F. D., Verheijen, M. A., van de Sanden, M. C. M., & Creatore, M. (2011). Plasma-Assisted Deposition of Au/SiO2 Multi-layers as Surface Plasmon Resonance-Based Red-Colored Coatings. Plasmonics, 6(2), 255-260. https://doi.org/10.1007/s11468-010-9197-9 (Original work published 2025)
Illiberi, A., Kudlacek, P., Smets, A. H. M., Creatore, M., & van de Sanden, M. C. M. (2011). Effect of ion bombardment on the a-Si:H based surface passivation of c-Si surfaces. Applied Physics Letters, 98(24), 3. https://doi.org/10.1063/1.3601485 (Original work published 2025)
Zaharia, T., Kudlacek, P., Creatore, M., Groenen, R., Persoone, P., & van de Sanden, M. C. M. (2011). Improved adhesion and tribological properties of fast-deposited hard graphite-like hydrogenated amorphous carbon films. Diamond and Related Materials, 20(9), 1266-1272. https://doi.org/10.1016/j.diamond.2011.08.003 (Original work published 2025)
Bronneberg, A. C., Smets, A. H. M., Creatore, M., & van de Sanden, M. C. M. (2011). On the oxidation mechanism of microcrystalline silicon thin films studied by Fourier transform infrared spectroscopy. Journal of Non-Crystalline Solids, 357(3), 884-887. https://doi.org/10.1016/j.jnoncrysol.2010.11.001 (Original work published 2025)