E. Louis

Liu, F., Lee, C. J., Chen, J. Q., Louis, E., van der Slot, P. J. M., Boller, K. J., & Bijkerk, F. (2012). Ellipsometry with randomly varying polarization states. Optics Express, 20(2), 870-878. https://doi.org/10.1364/OE.20.000870 (Original work published 2025)

van den Boogaard, A. J. R., van Goor, F. A., Louis, E., & Bijkerk, F. (2012). Wavelength separation from extreme ultraviolet mirrors using phaseshift reflection. Optics Letters, 37, 160-162. https://doi.org/10.1364/OL.37.000160 (Original work published 2025)

Makhotkin, I. A., Zoethout, E., Louis, E., Yakunin, A. M., Mullender, S., & Bijkerk, F. (2012). Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge. Optics Express, 20(11), 11778-11786. https://doi.org/10.1364/OE.20.011778 (Original work published 2025)

van den Boogaard, A. J. R., Zoethout, E., Makhotkin, I. A., Louis, E., & Bijkerk, F. (2012). Influence of noble gas ion polishing species on extreme ultraviolet mirrors. Journal of Applied Physics, 112, 123502. https://doi.org/10.1063/1.4768915 (Original work published 2012)

Makhotkin, I., Zoethout, E., Louis, E., Yakunin, A. M., Muellender, S., & Bijkerk, F. (2012). Wavelength selection for multilayer coatings for lithography generation beyond extreme ultraviolet. Journal of Micro Nanolithography, MEMS and MOEMS, 11, 040501. https://doi.org/10.1117/1.JMM.11.4.040501 (Original work published)

Louis, E. (2012). Physics and technology development of multilayer EUV reflective optics (Universiteit Twente). Universiteit Twente, Enschede, Netherlands. Retrieved from http://doc.utwente.nl/82463/1/thesis_E_Louis.pdf (Original work published)

Makhotkin, I. A., Louis, E., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Seregin, A. Y., … Bijkerk, F. (2011). Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves. Physica Status Solidi A-Applications and Materials Science, 208, 2597-2600. https://doi.org/10.1002/pssa.201184256 (Original work published 2025)

Rouzee, A., Johnsson, P., Gryzlova, E. V., Fukuzawa, H., Yamada, A., Siu, W., … Ueda, K. (2011). Angle-resolved photoelectron spectroscopy of sequential three-photon triple ionization of neon at 90.5 eV photon energy. Physical Review A, 83(3), 031401. https://doi.org/10.1103/PhysRevA.83.031401 (Original work published 2025)

Loch, R. A., Dubrouil, A., Sobierajski, R., Descamps, D., Fabre, B., Lidon, P., … Mairesse, Y. (2011). Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. Optics Letters, 36(17), 3386-3388. https://doi.org/10.1364/OL.36.003386 (Original work published 2025)

Chen, J. Q., Louis, E., Wormeester, H., Harmsen, R., van de Kruijs, R., Lee, C. J., … Bijkerk, F. (2011). Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry. Measurement Science & Technology, 22(10), 105705. https://doi.org/10.1088/0957-0233/22/10/105705 (Original work published 2025)