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High Repetition Rate Krf Laser Plasma X-Ray Source for Microlithography

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Abstract

As part of a development programme for a high-intensity laser-plasma X-ray source, experiments have been carried out using a high repetition rate excimer laser (up to 100 Hz; 249 nm, 300 mJ). Remedies are given to problems inherent to operating this type of source at high repetition rates. The combined remedies eliminate the target debris problem. X-ray mask structures down to 0.5-mu-m have been imaged. After implementation of tested upgrades, this source will enable exposures within ten seconds per stepfield.

Year of Publication
1992
Journal
Microelectronic Engineering
Volume
17
Number
1-4
Number of Pages
219-222
Date Published
03/1992
ISBN Number
0167-9317
DOI
PId
6649a9968d12c4275f4dc9f76949986a
Journal Article
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Citation
Bijkerk, F., Louis, E., Turcu, E. C. I., & Tallents, G. J. (1992). High Repetition Rate Krf Laser Plasma X-Ray Source for Microlithography. Microelectronic Engineering, 17, 219-222. https://doi.org/10.1016/0167-9317(92)90045-s (Original work published 1992)