F. Bijkerk

de Rooij-Lohmann, V., Yakshin, A. E., Zoethout, E., Verhoeven, J., & Bijkerk, F. (2011). Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection. Applied Surface Science, 257(14), 6251-6255. https://doi.org/10.1016/j.apsusc.2011.02.054 (Original work published 2011)

Kozhevnikov, I. V., van der Meer, R., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. (2011). Analytic theory of soft x-ray diffraction by lamellar multilayer gratings. Optics Express, 19(10), 9172-9184. https://doi.org/10.1364/OE.19.009172 (Original work published 2011)

Chen, J. Q., Louis, E., Harmsen, R., Tsarfati, T., Wormeester, H., van Kampen, M., … Bijkerk, F. (2011). In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers. Applied Surface Science, 258(1), 7-12. https://doi.org/10.1016/j.apsusc.2011.07.121 (Original work published 2011)

Medvedev, V. V., Yakshin, A. E., van de Kruijs, R. W. E., Krivtsun, V. M., Yakunin, A. M., Koshelev, K. N., & Bijkerk, F. (2011). Infrared suppression by hybrid EUV multilayer-IR etalon structures. Optics Letters, 36(17), 3344-3346. https://doi.org/10.1364/OL.36.003344 (Original work published 2011)

van den Boogaard, A. J. R., Louis, E., Zoethout, E., Goldberg, K. A., & Bijkerk, F. (2011). Characterization of Mo/Si multilayer growth on stepped topographies. Journal of Vacuum Science & Technology B, 29(5), 6. https://doi.org/10.1116/1.3628640 (Original work published 2011)

Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2011). In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films. Applied Surface Science, 257(7), 2707-2711. https://doi.org/0.1016/j.apsusc.2010.10.049 (Original work published 2011)

Grecea, M. L., Gleeson, M. A., van Schaik, W., Kleyn, A. W., & Bijkerk, F. (2011). Co-adsorption of NH(3) and SO(2) on quartz(0001): Formation of a stabilized complex. Chemical Physics Letters, 511(4-6), 270-276. https://doi.org/10.1016/j.cplett.2011.06.076 (Original work published 2011)

Sobierajski, R., Bruijn, S., Khorsand, A. R., Louis, E., van de Kruijs, R. W., Burian, T., … Bijkerk, F. (2011). Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express, 19(1), 193-205. https://doi.org/10.1364/OE.19.000193 (Original work published 2011)

de Rooij-Lohmann, V., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Kleyn, A. W., Keim, E. G., … Bijkerk, F. (2010). Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics, 108, 5. Retrieved from <Go to ISI>://000280000400090 (Original work published 2010)

Kozhevnikov, I. V., van der Meer, R., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. (2010). High-resolution, high-reflectivity operation of lamellar multilayer amplitude gratings: identification of the single-order regime. Optics Express, 18, 16234-16242. Retrieved from <Go to ISI>://000280693300105 (Original work published 2010)