F. Bijkerk

Kozhevnikov, I. V., van der Meer, R., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. (2010). High-resolution, high-reflectivity operation of lamellar multilayer amplitude gratings: identification of the single-order regime. Optics Express, 18, 16234-16242. Retrieved from <Go to ISI>://000280693300105 (Original work published 2010)

Chen, J. Q., Louis, E., Verhoeven, J., Harmsen, R., Lee, C. J., Lubomska, M., … Bijkerk, F. (2010). Secondary electron yield measurements of carbon covered multilayer optics. Applied Surface Science, 257, 354-361. Retrieved from <Go to ISI>://000281674200003 (Original work published 2010)

Dobrovolskiy, S., Yakshin, A. E., Tichelaar, F. D., Verhoeven, J., Louis, E., & Bijkerk, F. (2010). Formation of Si/SiC multilayers by low-energy ion implantation and thermal annealing. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms, 268, 560-567. Retrieved from <Go to ISI>://000276053700004 (Original work published 2010)

Yakshin, A. E., Kozhevnikov, I. V., Zoethout, E., Louis, E., & Bijkerk, F. (2010). Properties of broadband depth-graded multilayer mirrors for EUV optical systems. Optics Express, 18, 6957-6971. Retrieved from <Go to ISI>://000276602000050 (Original work published 2010)

de Rooij-Lohmann, V., Kozhevnikov, I. V., Peverini, L., Ziegler, E., Cuerno, R., Bijkerk, F., & Yakshin, A. E. (2010). Roughness evolution of Si surfaces upon Ar ion erosion. Applied Surface Science, 256, 5011-5014. Retrieved from <Go to ISI>://000276929600026 (Original work published 2010)

Kuznetsov, A. S., van de Kruijs, R. W. E., Gleeson, M. A., Schmid, K., & Bijkerk, F. (2010). Hydrogen interaction with EUVL-relevant optical materials. Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques, 4, 563-566. Retrieved from <Go to ISI>://000280703600002 (Original work published 2010)

de Rooij-Lohmann, V., Veldhuizen, L. W., Zoethout, E., Yakshin, A. E., van de Kruijs, R. W. E., Thijsse, B. J., … Bijkerk, F. (2010). Chemical interaction of B4C, B, and C with Mo/Si layered structures. Journal of Applied Physics, 108, 6. Retrieved from <Go to ISI>://000284270900129 (Original work published 2010)

Tsarfati, T., van de Kruijs, R. W. E., Zoethout, E., Louis, E., & Bijkerk, F. (2010). Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics. Thin Solid Films, 518, 7249-7252. Retrieved from <Go to ISI>://000282915100017 (Original work published 2010)

Khorsand, A. R., Sobierajski, R., Louis, E., Bruijn, S., van Hattum, E. D., van de Kruijs, R. W. E., … Bijkerk, F. (2010). Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express, 18, 700-712. Retrieved from <Go to ISI>://000273860400032 (Original work published 2010)

Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., & Bijkerk, F. (2010). Thermally induced decomposition of B4C barrier layers in Mo/Si multilayer structures. Surface & Coatings Technology, 205, 2469-2473. Retrieved from <Go to ISI>://000286343100091 (Original work published 2010)